03/19/2026
Nikon NIS-Elements Slide Scanning Module
Slide scanning made easy without compromising on optical quality.
The new slide scanning solution from Nikon brings together the best of both worlds: a user friendly, yet extremely powerful software module that has been developed for robust, reliable hardware. Using the ECLIPSE Ni-E microscope in combination with the brand new NIS-Elements Slide Scanning module, finally there is no need to sacrifice image quality for the sake of simplicity.
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Contact for press inquiries
Dr. Martin Kiesel
+49 171 5510042
martin.kiesel@nikon.com
+49 171 5510042
martin.kiesel@nikon.com
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