03/19/2026

Nikon NIS-Elements Slide Scanning Module

Slide scanning made easy without compromising on optical quality.

The new slide scanning solution from Nikon brings together the best of both worlds: a user friendly, yet extremely powerful software module that has been developed for robust, reliable hardware. Using the ECLIPSE Ni-E microscope in combination with the brand new NIS-Elements Slide Scanning module, finally there is no need to sacrifice image quality for the sake of simplicity.

Contact for press inquiries

Dr. Martin Kiesel
+49 171 5510042
martin.kiesel@nikon.com

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