The Bruker Nano Analytics division develops, manufactures and markets systems for elemental and structural analysis on the micro and nano scale. This includes a unique range of analysis systems for materials characterization on electron microscopes (EM). Our EM analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM provide comprehensive compositional and structural materials analysis. The M-series for micro X-ray fluorescence spectrometry (Micro-XRF), including the M4 TORNADO, the handheld X-ray fluorescence (XRF) analyzers TITAN and TRACER 5 as well as the counter top X-ray fluorescence (XRF) analyzer CTX, enable non-destructive element analysis. Our total reflection X-ray fluorescence (TXRF) spectrometer, S4 T-STAR, adds to our range of nano analysis solutions.