The Bruker Nano Analytics division (headquarters: Bruker Nano GmbH) develops, manufactures, and markets systems for elemental and structural analysis on the micro and nano scale.

Our unique range of analytical tools for comprehensive compositional and structural material analysis in electron microscopes includes EDS for SEM and TEM, WDS, EBSD and micro-XRF on SEM.

On top we offer a variety of benchtop micro-X-ray fluorescence (micro-XRF) spectrometers for spatially resolved composition analysis and total reflection X-ray fluorescence (TXRF) instruments for trace element analysis for a multitude of applications. Our handheld XRF analyzers as well as the mobile/portable countertop XRF analyzer, enabling non-destructive and on-site element analysis complete the range.